Glitch detection for semiconductor test system
US6377065B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 13, 2000 |
| Grant date | Apr 23, 2002 |
| Priority date | — |
| Expiry date | Apr 13, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31922
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semiconductor test system has a glitch detection function for detecting glitches in an output signal from a device under test to accurately evaluate the device under test (DUT) . The semiconductor test system includes an event memory for storing event data, an event generator for producing test patterns, strobe signals and expected patterns based on the event data from the event memory, a pin electronics for transmitting the test pattern from the event generator to the DUT and receiving an output signal of the DUT and sampling the output signal by timings of the strobe signals, a pattern comparator for comparing sampled output data with the expected patterns, and a glitch detection unit for receiving the output signal from the DUT and detecting a glitch in the output signal by counting a number of edges in the output signal and comparing an expected number of edges.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.