Patent · US Expired

Integration of remote plasma generator with semiconductor processing chamber

US6387207B1 · kind B1 · utility

840Cited by
1References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 28, 2000
Grant dateMay 14, 2002
Priority date
Expiry dateApr 28, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32458
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A compact, self-contained remote plasma generator is mounted on the lid of a semiconductor processing chamber to form an integrated substrate processing system. The remote plasma generator is activated in a clean operation to generate cleaning plasma species to provide better cleaning of the chamber and lower perfluorocarbon emissions than in situ plasma clean processes. A three-way valve is adjustable to control gas flow to the chamber. During the clean operation, the three-way valve directs a cleaning plasma precursor from a first gas line to the remote plasma generator to generate cleaning plasma species which are flowed to the chamber for cleaning deposits therein. During a deposition process, the three-way valve directs a first process gas from the flat gas line to the chamber, bypassing the remote plasma generator. The first process gas is typically mixed with a second process gas supplied from a second gas line in a mixing device prior to entering the chamber for depositing a layer on a substrate disposed therein.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.