Patent · US Expired

Integrated circuit and method for testing it

US6401224B1 · kind B1 · utility

9Cited by

14References

10Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Sabine Schoniger · Hersbruck, DE
Peter Schrogmeier · Hersbruck, DE
Thomas Hein · Hersbruck, DE
Stefan Dietrich · Potsdam, DE

Key dates

Filing date	Mar 2, 1999
Grant date	Jun 4, 2002
Priority date	—
Expiry date	Mar 2, 2019

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/3185
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test method suitable for testing at least one integrated circuit which, on a main area, has contact areas that serve to transfer signals during a first operating mode of the circuit. Only some of the contact areas are contact-connected to test contacts of a test apparatus and the circuit is put into a second operating mode in which the signals which are transferred via at least one of the non-contact-connected contact areas in the first operating mode are transferred via at least one of the contact-connected contact areas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.