Patent · US Expired

Method of fabricating cup-shape cylindrical capacitor of high density DRAMs

US6403418B2 · kind B2 · utility

7Cited by
6References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 18, 2000
Grant dateJun 11, 2002
Priority date
Expiry dateApr 18, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/0335
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of fabricating cup shape cylindrical capacitor of high density Dynamic Random Access Memory (DRAM) cells is disclosed. The cup shape capacitor shape is achieved by first depositing a first polysilicon layer on a silicon substrate; a third dielectric layer is then formed overlaying the first polysilicon layer, and defined third dielectric crowns by the conventional lithography and etching techniques; a second polysilicon layer is deposited overlaying the third dielectric crowns and first polysilicon layer; the first polysilicon and second polysilicon layers are then vertically anisotropically etchback to define storage nodes of the cylindrical capacitors; the third dielectric crowns are removed; finally, the capacitor dielectric layer and the polysilicon top plate of the capacitor are formed to complete the cup shape cylindrical capacitor formation for high density DRAM applications.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.