Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical system
US6403946B1 · kind B1 · utility
0Cited by
4References
3Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Feb 25, 2000 |
| Grant date | Jun 11, 2002 |
| Priority date | — |
| Expiry date | Feb 25, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/071
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electro-optic sampling probe for preventing noise from being transmitted to photodiodes and improving the measurement accuracy is disclosed. In the probe, the optical system module comprises wavelength plates and polarized beam splitters arranged along an optical path of the relevant laser beam, and photodiodes facing the polarized beam splitters, wherein each photodiode is fixed via an insulating material to the main frame of the optical system module.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.