Multiple end of test signal for event based test system
US6404218B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2000 |
| Grant date | Jun 11, 2002 |
| Priority date | — |
| Expiry date | Apr 24, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31922
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An event based test system for testing semiconductor devices under test (DUT). The event based test system is freely configured to a plurality of groups of sin units where each group is able to perform test operations independently from the other. The start and end timings of the test in each group are independently made by generating multiple end of test signals. The event based test system includes a plurality of pin units to be assigned to pins of the DUT, a signal generator for generating an end of test signal for indicating an end of current test which is generated for each pin unit independently from other pin units, and a system controller for controlling an overall operation in the event based test system by communicating with each pin unit. The end of test signal for each pin unit is selected by condition specified by the system controller and the selected end of test signal is provided to the system controller and to the other pin units.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.