Probe for electro-optic sampling oscilloscope
US6407561B1 · kind B1 · utility
Assignees
Inventors
Key dates
| Filing date | May 25, 2000 |
| Grant date | Jun 18, 2002 |
| Priority date | — |
| Expiry date | May 25, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/071
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for an electro-optic sampling oscilloscope is provided, capable of obtaining an improved accuracy in measurement of the test measuring signals by controlling a temperature of an electro-optic element so as to be maintained at a constant such that the refractive index of the electro-optic element does not change due to the temperature change. The probe for the electro-optic sampling oscilloscope comprises a reflecting film at one end and a metal pin provided on the surface of the reflecting film such that the optical property of the electro-optic film changes according to an electric field applied through the metal pin. The probe further comprises a temperature detecting portion, disposed so as to contact with the electro-optic element, for detecting and outputting the temperature of the electro-optic element, a temperature adjusting portion, disposed so as to contact with the electro-optic element facing the temperature detecting portion about the electro-optic element, and a temperature controlling portion for controlling the temperature adjusting portion based on the result of the temperature detection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.