Patent · US Expired

Method of reducing noise generated by arc lamps in optical systems employing slits

US6411381B1 · kind B1 · utility

1Cited by
15References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 2, 2000
Grant dateJun 25, 2002
Priority date
Expiry dateMay 2, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J3/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A spectroscopy system having enhanced noise reduction that comprises (i) an arc lamp light source of emitted light, which emitted light is projected as an image of the light source; (ii) a slit aperture through which the emitted light is projected; and (iii) a detector operably associated with the slit aperture for detecting the emitted light. The slit aperture, the arc lamp, and the image of the arc lamp each have a major axis. The major axis of the slit aperture is oriented essentially orthogonally to the major axis of the image of the arc lamp, so that the signal-to-noise ratio of the spectroscopy system is improved as compared to the signal-to-noise ratio of the spectroscopy system when the major axis of the slit aperture is oriented essentially parallel to the major axis of the image of the arc lamp.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.