Patent · US Expired

Dense multi-gated device design

US6433372B1 · kind B1 · utility

5Cited by
17References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 17, 2000
Grant dateAug 13, 2002
Priority date
Expiry dateMar 17, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/023

Abstract

A multigated FET having reduced diffusion capacitance, self-compensating effective channel length, improved short channel effects control, and enhanced density. Forming the FET by providing a plurality of separated insulated gates on a substrate, including forming insulating material on at least four surfaces of each of the gates, forming a dielectric layer on the substrate between the insulated gates, depositing and planarizing a layer of conductive material on and between the insulated gates down to the insulating material on the top surface of the insulated gates, and implanting diffusion regions into the substrate, adjacent to and beneath a portion of two distal ones of the plurality of insulated gates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.