Patent · US Expired

Two moment RC delay metric for performance optimization

US6434729B1 · kind B1 · utility

6Cited by
16References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 4, 2000
Grant dateAug 13, 2002
Priority date
Expiry dateApr 4, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/327
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An efficient method for optimizing RC circuit design to reduce delay. The method comprises: calculating a first moment and a second moment of impulse response for an RC circuit; (2) computing a delay value for each node of the RC circuit utilizing the first and second moments by multiplying the natural logarithm of 2 with a division of the squared power of the first impulse moment by the square root of the second impulse moment; and (3) analyzing each node to determine if the delay at that node is at a desired optimization condition for optimizing the circuit response.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.