Inventor · Austin, TX, US

Anirudh Devgan

29Patents
12h-index
23Co-inventors
77Inventor score

Filing activity: Sep 15, 1997 → Oct 29, 2013

Most-cited inventions

PatentTitleAreaCited byStatus
US6117182A Optimum buffer placement for noise avoidance Physics 213 Expired
US6347393B1 Method and apparatus for performing buffer insertion with accurate gate and interconnect delay computation Physics 212 Expired
US7376001B2 Row circuit ring oscillator method for evaluating memory cell performance Physics 66 Expired
US7301835B2 Internally asymmetric methods and circuits for evaluating static memory cell dynamic stability Physics 59 Expired
US6842714B1 Method for determining the leakage power for an integrated circuit Physics 46 Expired
US6029117A coupled noise estimation method for on-chip interconnects Physics 31 Expired
US7137080B2 Method for determining and using leakage current sensitivities to optimize the design of an integrated circuit Physics 26 Expired
US7000205B2 Method, apparatus, and program for block-based static timing analysis with uncertainty Physics 21 Expired
US6308304A Method and apparatus for realizable interconnect reduction for on-chip RC circuits Physics 21 Expired
US6662149B1 Method and apparatus for efficient computation of moments in interconnect circuits Physics 21 Expired
US6044209A Method and system for segmenting wires prior to buffer insertion Physics 19 Expired
US8572523B2 Lithography aware leakage analysis Physics 17 Active
US7304895B2 Bitline variable methods and circuits for evaluating static memory cell dynamic stability Physics 11 Active
US7036104B1 Method of and system for buffer insertion, layer assignment, and wire sizing using wire codes Physics 9 Expired
US7483322B2 Ring oscillator row circuit for evaluating memory cell performance Physics 8 Active
US8001493B2 Efficient method and computer program for modeling and improving static memory performance across process variations and environmental conditions Physics 7 Active
US6434729B1 Two moment RC delay metric for performance optimization Physics 6 Expired
US7302661B2 Efficient electromagnetic modeling of irregular metal planes Physics 3 Expired
US7561483B2 Internally asymmetric method for evaluating static memory cell dynamic stability Physics 3 Active
US7434188B1 Lithographically optimized placement tool Physics 2 Expired
US6868533B2 Method and system for extending delay and slew metrics to ramp inputs Physics 2 Expired
US8473876B2 Lithography aware timing analysis Physics 1 Active
US7558136B2 Internally asymmetric methods and circuits for evaluating static memory cell dynamic stability Physics 1 Active
US6950996B2 Interconnect delay and slew metrics based on the lognormal distribution Physics 1 Expired
US7827514B2 Efficient electromagnetic modeling of irregular metal planes Physics 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.