Patent · US Expired

Method for epitaxial bipolar BiCMOS

US6448124B1 · kind B1 · utility

6Cited by
16References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 12, 1999
Grant dateSep 10, 2002
Priority date
Expiry dateNov 12, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/038
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming a BiCMOS integrated circuit is provided which comprises the steps of: (a) forming a first portion of a bipolar device in first regions of a substrate; (b) forming a first protective layer over said first regions to protect said first portion of said bipolar devices; (c) forming field effect transistor devices in second regions of said substrate; (d) forming a second protective layer over said second regions of said substrate to protect said field effect transistor devices; (e) removing said first protective layer; (f) forming a second portion of said bipolar devices in said first regions of said substrate; and (g) removing said second protective layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.