Patent · US Expired

Memory cell with trench, and method for production thereof

US6448610B2 · kind B2 · utility

11Cited by
7References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 7, 2001
Grant dateSep 10, 2002
Priority date
Expiry dateMar 7, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/482

Abstract

The invention relates to a memory cell that has a trench. A trench capacitor is configured in the trench. In addition, a vertical transistor is formed in the trench, above the trench capacitor. To connect the gate material of the vertical transistor to a word line, a dielectric layer (12) having an internal opening (13) is provided in the trench (3) above the gate material (23). The dielectric layer is in the form of a dielectric ring. The dielectric ring allows self-aligned connection of the word line to the gate material of the vertical transistor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.