Method and apparatus for monitoring the light emitted from an illumination apparatus for an optical measuring instrument

US6456373B1 · kind B1 · utility

Assignee

• Leica Microsystems Jena GmbH · DE

Inventors

• Joachim Wienecke · Jena, DE
• Kuno Backhaus · Stadtroda, DE
• Detlef Wolter · Jena, DE
• Matthias Slodowski · Jena, DE
• Horst-Dieter Jaritz · Jena, DE

Key dates

• Filing date: Nov 6, 2000
• Grant date: Sep 24, 2002
• Expiry date: Mar 17, 2021

Classification

• Technology area (CPC H): Electricity
• CPC primary: H05B47/28
• WIPO field: Electrical machinery, apparatus, energy
• WIPO sector: Electrical engineering

Abstract

In a method for monitoring the measurement light emitted from an illumination apparatus for an optical measuring instrument, a continuous sensing of measurement light parameters is performed. The sensed measurement light parameters are compared to predefined setpoints. Any deviation from the predefined parameter ranges associated with the setpoints is signaled. This signal is used to initiate a lamp exchange on the illumination apparatus, which has multiple lamps that can be selectively switched on and off individually or in groups. Also described is a corresponding illumination apparatus that preferably performs a lamp exchange automatically. The result is to identify a point in time for a lamp change that is optimal with regard to measurement accuracy and the longest possible utilization of the lamps, so that a measurement light quality that remains consistent during continuous operation can reliably be maintained within predefined tolerance ranges.