Patent · US Expired

Graded metallic leads for connection to microelectronic elements

US6465744B2 · kind B2 · utility

11Cited by
14References
37Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 26, 1999
Grant dateOct 15, 2002
Priority date
Expiry dateMar 26, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24983
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Flexible leads for making electrical connection in microelectronic components includes two metallic layers. The structural or core layer of the lead is formed having a hardness greater than the hardness of the second layer. The relative hardness between the first and second layers is achieved by controlling the grain size during deposition of the respective layers from an electroless or electroplating bath.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.