Patent · US Expired

Inductively-coupled-plasma ionized physical-vapor deposition apparatus, method and system

US6471830B1 · kind B1 · utility

26Cited by
50References
65Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 3, 2000
Grant dateOct 29, 2002
Priority date
Expiry dateOct 3, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32568
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A system and related method are disclosed for performing an inductively-coupled-plasma ionized physical-vapor deposition (“PVD”) process for depositing material layers onto a substrate. Within a PVD process chamber are contained a target/cathode assembly, a chuck assembly, a process medium, a variable height inductively-coupled (“VHIC”) ionization coil segment and an antenna actuator for controlling the relative vertical position of the variable height inductively-coupled ionization coil segment. The VHIC coil segment can be contained within a dielectric liner and can be covered by a multi-slotted grounded electrostatic shield. The VHIC ionization coil segment can comprise one or more zones comprised of one or more coil loops powered by one or more radio-frequency power supplies. Each zone can be powered through an adjustable passive electrical component for providing multiple inductive zone operations during a deposition process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.