Patent · US Expired

Memory device having memory cells with magnetic tunnel junction and tunnel junction in series

US6473337B1 · kind B1 · utility

45Cited by
5References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 24, 2001
Grant dateOct 29, 2002
Priority date
Expiry dateOct 24, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/16
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory device includes dual tunnel junction memory cells having a magnetic tunnel junction in series with a tunnel junction. The magnetic tunnel junction can be changed from a first resistance state to a second resistance state during a write operation. The magnetic tunnel junction can have a differing resistance-voltage characteristic than the tunnel junction, and the differing resistance-voltage characteristics allow the magnetic tunnel junction to be blown without blowing the tunnel junction during a write operation. The change in resistance state of the magnetic tunnel junction changes the resistance of the selected memory cell, which is detectable during a read operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.