Patent · US Expired

Capillary proximity heads for single wafer cleaning and drying

US6488040B1 · kind B1 · utility

117Cited by
5References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 30, 2000
Grant dateDec 3, 2002
Priority date
Expiry dateJul 29, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S134/902
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A wafer cleaner and dryer to be used in wafer manufacturing operations is provided. The wafer cleaner and dryer has a proximity head which moves toward a wafer surface to complete either a cleaning or a drying operation. The proximity head includes a plurality of source inlets where the plurality of source inlets generates a first pressure on a fluid film present on the wafer surface when the proximity head is in a first position that is close to the wafer surface. The proximity head also contains a plurality of source outlets which introduces a second pressure on the fluid film present on the wafer surface when the proximity head is in the first position. The first pressure generated by the plurality of source inlets is greater than the second pressure created by the plurality of source outlets so as to create a pressure difference where the pressure difference causes removal of the fluid film from the wafer surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.