Patent · US Expired

Fuse, memory incorporating same and method

US6489244B2 · kind B2 · utility

0Cited by
13References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 15, 2001
Grant dateDec 3, 2002
Priority date
Expiry dateMay 15, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of making a fuse and a fuse, together with systems and integrated circuits where the fuse provides benefits, are described. A fuse comprising a conductive material is formed on a substrate. A series of dielectric layers having a composite thickness is formed on the substrate and the fuse. The series of dielectric layers serves to insulate a series of conductive layers from each other. The conductive layers are disposed above portions of the substrate. An opening is formed extending through a passivation layer and the series of dielectric layers. The opening exposes a portion of the fuse. Another dielectric layer is formed on the fuse and the fuse may thereafter be programmed by directing a laser beam onto the fuse through the opening.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.