Patent · US Expired

Process for making a planar integrated circuit interconnect

US6492259B2 · kind B2 · utility

8Cited by
10References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 19, 2001
Grant dateDec 10, 2002
Priority date
Expiry dateJul 19, 2021

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/926
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device having a planar integrated circuit interconnect and process of fabrication. The planar integrated circuit comprises a substrate having a first line wire formed in the substrate, a dielectric layer formed on the substrate, a second line wire formed in the dielectric layer, a contact via formed within the dielectric layer extending through the dielectric layer from the second line wire to the first line wire, and a dummy via which extends into the dielectric layer and is filled with a low dielectric material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.