Patent · US Expired

Method to deposit a seeding layer for electroless copper plating

US6495200B1 · kind B1 · utility

51Cited by
9References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 7, 1998
Grant dateDec 17, 2002
Priority date
Expiry dateDec 7, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76874
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of for electroless copper deposition using a Pd/Pd acetate seeding layer formed in using only two components (Pd acetate and solvent) to form an interconnect for a semiconductor device. The invention has two preferred embodiments. The first embodiment forms a Key seed layer composed of Pd/Pd acetate by a spin-on or dip process for the electroless plating of a Cu plug. The second embodiment forms a Pd passivation cap layer over the Cu plug to prevent the Cu plug from oxidizing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.