BIST circuit for variable impedance system
US6509778B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2001 |
| Grant date | Jan 21, 2003 |
| Priority date | — |
| Expiry date | Mar 15, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3187
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a programmable impedance driver that includes two sets of impedance devices, two primary counters and two test counters. The primary counters selectively activate individual ones of the impedance devices to vary an overall impedance of the driver and the test counters verify the counting operation of the primary counters during manufacturing testing of the driver. Therefore, the built-in self-test (BIST) aspect of the invention easily detects if one of the counters will become stuck during normal usage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.