Patent · US Expired

Method for making a semiconductor device

US6514847B1 · kind B1 · utility

153Cited by
12References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 25, 2000
Grant dateFeb 4, 2003
Priority date
Expiry dateDec 18, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3025
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a semiconductor device, a plurality of wiring films are formed on a front surface of a base comprising an insulating resin and having electrode-forming holes, the surfaces of the wiring films and the surface of the base being positioned on the same plane and at least parts of the wiring films overlapping with the electrode-forming holes; a conductive material is embedded into the electrode-forming holes to form external electrodes on the back surface, away from the wiring films, of the base; a semiconductor element is positioned on the front surface of the base with an insulating film therebetween, the back surface of the semiconductor element being bonded to said front surface of the base; wires bond the electrodes of the semiconductor element to the corresponding wiring films; and a resin seals the wiring films and the wires.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.