Patent · US Expired

Method and device for determining the dependence of a first measuring quantity on a second measuring quantity

US6526372B1 · kind B1 · utility

17Cited by

11References

16Claims

0Family size

Assignee

Aoti Operating Company, INC · US

Inventors

Benno Orschel · Saga, JP
Jan Helm · Berlin, DE
Bernd Srocka · Berlin, DE

Key dates

Filing date	Apr 18, 2001
Grant date	Feb 25, 2003
Priority date	—
Expiry date	Apr 18, 2021

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2656
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

For determining the dependence of a first measuring quantity (Y) on a second measuring quantity (P) the second measuring quantity (P) is periodically modified with a frequency (f0). The first measuring quantity (Y) changing accordingly is measured. From the obtained measuring signal of the first measuring quantity (Y) the components of the first measuring quantity (Y) are determined with at least a plurality of frequencies. From the components thus determined the first measuring quantity (Y) is reconstructed for at least a plurality of values of the second measuring quantity (P) by signal processing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.