Aoti Operating Company, INC
4Patents
0Active
4Granted
25Portfolio score
Filing activity: Mar 5, 1998 → Mar 27, 2002
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6526372B1 | Method and device for determining the dependence of a first measuring quantity on a second measuring quantity | Physics | 17 | Expired |
| US6911347B2 | Method to detect surface metal contamination | Physics | 10 | Expired |
| US7098052B2 | Detection and classification of micro-defects in semi-conductors | Physics | 4 | Expired |
| US6396649B1 | Optical instruments | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.