Bernd Srocka
13Patents
2h-index
6Co-inventors
47Inventor score
Filing activity: Apr 18, 2001 → Oct 14, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6526372B1 | Method and device for determining the dependence of a first measuring quantity on a second measuring quantity | Physics | 17 | Expired |
| US7265571B2 | Method and device for determining a characteristic of a semiconductor sample | Physics | 4 | Expired |
| US8837807B2 | Inspection method with color correction | Physics | 2 | Active |
| US9646372B2 | Inspection apparatus | Physics | 2 | Active |
| US8817089B2 | Inspection system | Physics | 1 | Active |
| US10132612B2 | Method and assembly for determining the thickness of a layer in a sample stack | Physics | 0 | Active |
| US9587930B2 | Method and assembly for determining the thickness of a layer in a sample stack | Physics | 0 | Active |
| US9500582B2 | Method for detecting buried layers | Physics | 0 | Active |
| US9176070B2 | Inspection assembly | Physics | 0 | Active |
| US9671602B2 | Measurement method for height profiles of surfaces using a differential interference contrast image | Physics | 0 | Active |
| US12025424B2 | Device and method for measuring height profiles on an object | Physics | 0 | Active |
| US9217633B2 | Inspection arrangement | Physics | 0 | Active |
| US12235209B2 | Device and method for measuring the profile of flat objects comprising unknown materials | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.