Patent · US Expired

Sensing circuit for memory cells

US6535428B2 · kind B2 · utility

21Cited by
2References
58Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 14, 2001
Grant dateMar 18, 2003
Priority date
Expiry dateJun 14, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/5642
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A sensing circuit for sensing a memory cell, the sensing circuit having a first circuit branch electrically connectable to the memory cell to receive a memory cell current, the first circuit branch having at least one first transistor that, when the first circuit branch is connected to the memory cell, is coupled thereto substantially in a cascode configuration. A bias current generator is operatively associated with the first transistor for forcing a bias current to flow therethrough.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.