Testable read-only memory for data memory redundant logic

US6536003B1 · kind B1 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Laurent Gaziello · Nice, FR
• Klaus Oberlander · San Jose, US
• Steffen Paul · Baierbrunn, DE
• Volker Schöber · Hersbruck, DE
• Sabeen Randhawa · Mountain View, US
• Paolo Ienne · Pully, CH
• Yannick Martelloni · Poing, DE
• Rod G. Fleck · Bellevue, US

Key dates

• Filing date: Feb 8, 2000
• Grant date: Mar 18, 2003
• Expiry date: Feb 8, 2020

Classification

• Technology area (CPC G): Physics
• CPC primary: G11C29/789
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

The testable read-only memory for data memory redundant logic has read-only memory units for storage of determined fault addresses of faulty data memory units. The serviceability of each read-only memory unit can be checked by application of input test data and by comparison of read output test data with expected nominal output test data.