Patent · US Expired

Megasonic treatment apparatus

US6539952B2 · kind B2 · utility

31Cited by
28References
21Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 24, 2001
Grant dateApr 1, 2003
Priority date
Expiry dateAug 2, 2021

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S134/902
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

The invention provides an apparatus and method for cleaning or etching wafers. The invention further provides a megasonic transducer designed to apply mechanical vibrations to a layer of fluid in contact with a wafer. The electromechanical transducer is housed in a quartz or sapphire lens which is chemically compatible with the layer of fluid, and sealed to protect the housing interior from fluids and chemical fumes. An electrical power source produces a signal that is sent to the transducer to generate a megasonic wave. The wave travels between the lens and the wafer, through the layer of fluid, dislodging small particles from the wafer which are then removed in the fluid stream. In one embodiment of the present invention, a wafer to be cleaned is placed on a rotatable support below a transducer assembly. A fluid is introduced through the transducer assembly to provide a layer of fluid between the lens and wafer. In a wafer etch application, the megasonic energy is used to enhance the etch rate on the surface of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.