Patent · US Expired

Method for forming three dimensional semiconductor structure and three dimensional capacitor

US6559004B1 · kind B1 · utility

21Cited by
1References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 11, 2001
Grant dateMay 6, 2003
Priority date
Expiry dateDec 11, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for forming a three dimensional semiconductor structure which has vertical capacitor(s) but not horizontal capacitor(s). The method essentially at least includes these steps of forming bottom plates within dielectric layers, forming another dielectric layer over bottom plates, removing all dielectric layers over bottom plates, forming optional liner(s) and capacitor dielectric layers on bottom plates, and forming top plates over capacitor dielectric layers. Note that shape of bottom plates is alike to the bottom connection and verticle fingers, also note that each gap within bottom plates is filled by both capacitor dielectric layer and top plate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.