Patent · US Expired

Windows used in thermal processing chambers

US6559424B2 · kind B2 · utility

52Cited by
18References
41Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 2, 2001
Grant dateMay 6, 2003
Priority date
Expiry dateJul 27, 2021

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/481
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

An apparatus for heat treating semiconductor wafers in a thermal processing chamber using light energy is provided. In one embodiment, the apparatus contains a window located between the semiconductor wafer and the energy source. The window contains a member that defines at least one passage capable of being placed into communication with a coolant to cool the window and at least partially offset the “first wafer effect”. Additionally, in some embodiments, the window has a thickness greater than about 1 inch so that it can withstand pressures applied during wafer processing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.