Event based test system storing pin calibration data in non-volatile memory
US6567941B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 12, 2000 |
| Grant date | May 20, 2003 |
| Priority date | — |
| Expiry date | Apr 12, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An event based test system has a cost effective, error free, secure and simple way of managing the calibration data for all of the pin cards used therein. The test system has a large number of test channels for testing a semiconductor device under test (DUT) by applying test patterns to device pins of the DUT through the test channels and examining response outputs of the DUT. The test system includes a plurality of pin cards, each having a plurality of pin units therein to establish a part of the test channels, a non-volatile memory provided within each pin card for storing calibration data for compensating error factors involved in the pin units mounted in the corresponding pin card, and a microprocessor provided within each pin card for managing the calibration data and executing the calibration procedure for all of the pin units in the corresponding pin card, and wherein each pin unit is configured as an event tester in which a test, pattern or a strobe signal is directly generated based on event data stored in an event memory which define any changes from a previous event with reference to a time difference therefrom.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.