Patent · US Expired

Graded metallic leads for connection to microelectronic elements

US6573459B2 · kind B2 · utility

8Cited by
16References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 22, 2002
Grant dateJun 3, 2003
Priority date
Expiry dateJul 22, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24983
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Flexible leads for making electrical connection in microelectronic components includes two metallic layers. The structural or core layer of the lead is formed having a hardness greater than the hardness of the second layer. The relative hardness between the first and second layers is achieved by controlling the grain size during deposition of the respective layers from an electroless or electroplating bath.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.