Patent · US Expired

Process for producing a resistor in an integrated circuit and corresponding integrated static random access memory device having four transistors and two resistors

US6580130B1 · kind B1 · utility

7Cited by
15References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 13, 1999
Grant dateJun 17, 2003
Priority date
Expiry dateDec 13, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An integrated static random access memory device includes four transistors and two resistors defining a memory cell. The four transistors are in a semiconductor substrate and are mutually interconnected by a local interconnect layer. The local interconnect layer is under a first metal level and a portion of the local interconnect layer defines above the substrate a base metal level. The two resistors extend in contact with a portion of the local interconnect layer between the base metal level and the first metal level.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.