Patent · US Expired

Nitride based transistors on semi-insulating silicon carbide substrates

US6583454B2 · kind B2 · utility

121Cited by
10References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 29, 2001
Grant dateJun 24, 2003
Priority date
Expiry dateMar 29, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/8503

Abstract

A high electron mobility transistor (HEMT) is disclosed that includes a semi-insulating silicon carbide substrate, an aluminum nitride buffer layer on the substrate, an insulating gallium nitride layer on the buffer layer, an active structure of aluminum gallium nitride on the gallium nitride layer, a passivation layer on the aluminum gallium nitride active structure, and respective source, drain and gate contacts to the aluminum gallium nitride active structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.