Patent · US Expired

Hydrogen assisted undoped silicon oxide deposition process for HDP-CVD

US6596653B2 · kind B2 · utility

498Cited by
21References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 11, 2001
Grant dateJul 22, 2003
Priority date
Expiry dateMay 14, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02274
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming a silicon oxide layer over a substrate disposed in a high density plasma substrate processing chamber. The silicon oxide layer is formed by flowing a process gas including a silicon-containing source, an oxygen-containing source, an inert gas and a hydrogen-containing source into the substrate processing chamber and forming a high density plasma (i.e., a plasma having an ion density of at least 1×1011 ions/cm3) from the process gas to deposit said silicon oxide layer over said substrate. In one embodiment, the hydrogen-containing source in the process gas is selected from the group of H2, H2O, NH3, CH4 and C2H6.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.