Tetsuya Ishikawa
252Patents
38h-index
328Co-inventors
93Inventor score
Filing activity: Sep 12, 1991 → Mar 2, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6303523A | Plasma processes for depositing low dielectric constant films | Emerging Cross-Sectional Technologies | 649 | Expired |
| US6596653B2 | Hydrogen assisted undoped silicon oxide deposition process for HDP-CVD | Electricity | 498 | Expired |
| US6447651B1 | High-permeability magnetic shield for improved process uniformity in nonmagnetized plasma process chambers | Chemistry; Metallurgy | 471 | Expired |
| US6660662B2 | Method of reducing plasma charge damage for plasma processes | Chemistry; Metallurgy | 456 | Expired |
| US6929700B2 | Hydrogen assisted undoped silicon oxide deposition process for HDP-CVD | Electricity | 456 | Expired |
| US7036453B2 | Apparatus for reducing plasma charge damage for plasma processes | Chemistry; Metallurgy | 449 | Expired |
| US6170428A | Symmetric tunable inductively coupled HDP-CVD reactor | Electricity | 322 | Expired |
| US6182602A | Inductively coupled HDP-CVD reactor | Electricity | 304 | Expired |
| US5944902A | Plasma source for HDP-CVD chamber | Electricity | 293 | Expired |
| US6083344A | Multi-zone RF inductively coupled source configuration | Electricity | 287 | Expired |
| US6189483A | Process kit | Emerging Cross-Sectional Technologies | 287 | Expired |
| US5556501A | Silicon scavenger in an inductively coupled RF plasma reactor | Electricity | 246 | Expired |
| US5350479A | Electrostatic chuck for high power plasma processing | Emerging Cross-Sectional Technologies | 149 | Expired |
| US5761023A | Substrate support with pressure zones having reduced contact area and temperature feedback | Electricity | 122 | Expired |
| US6518195B1 | Plasma reactor using inductive RF coupling, and processes | Electricity | 113 | Expired |
| US5772771A | Deposition chamber for improved deposition thickness uniformity | Electricity | 101 | Expired |
| US6488807B1 | Magnetic confinement in a plasma reactor having an RF bias electrode | Electricity | 99 | Expired |
| US6068784A | Process used in an RF coupled plasma reactor | Electricity | 96 | Expired |
| US6348725B1 | Plasma processes for depositing low dielectric constant films | Emerging Cross-Sectional Technologies | 94 | Expired |
| US6660656B2 | Plasma processes for depositing low dielectric constant films | Emerging Cross-Sectional Technologies | 91 | Expired |
| US6486081B1 | Gas distribution system for a CVD processing chamber | Electricity | 88 | Expired |
| US5824607A | Plasma confinement for an inductively coupled plasma reactor | Electricity | 84 | Expired |
| US6853141B2 | Capacitively coupled plasma reactor with magnetic plasma control | Electricity | 84 | Expired |
| US6251792A | Plasma etch processes | Electricity | 82 | Expired |
| US6143078A | Gas distribution system for a CVD processing chamber | Electricity | 79 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.