Patent · US Expired

Circuit configuration and method for determining a time constant of a storage capacitor of a memory cell in a semiconductor memory

US6600680B2 · kind B2 · utility

4Cited by

4References

10Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Bernhard Sell · Dresden, DE
Jürgen Lindolf · Friedberg, DE
Martin Popp · Dresden, DE

Key dates

Filing date	Jul 1, 2002
Grant date	Jul 29, 2003
Priority date	—
Expiry date	Jul 1, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG11C11/401
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A ring oscillator has a multiplicity of inverters. An interconnect is connected between two of the inverters, and a storage capacitor to be measured, with its associated lead resistor, is coupled to the interconnect either via an interconnect or a transistor can selectively coupled and decouple the capacitor and the lead resistance. A measuring device is connected up to the ring oscillator and is used to determine a value for the oscillation frequency of the ring oscillator on the basis of which a value for the time constant of the storage capacitor can be determined.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.