Patent · US Expired

Circuit configuration with deactivatable scan path

US6601202B2 · kind B2 · utility

3Cited by

7References

4Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Herbert Palm · Hohenkirchen, DE
Michael Smola · Munich, DE
Stefan Wallstab · Birkenfeld, DE

Key dates

Filing date	Mar 28, 2001
Grant date	Jul 29, 2003
Priority date	—
Expiry date	Jul 18, 2021

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318555
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A circuit configuration with a deactivatable scan path, includes a number of function blocks each connected to at least one other of the function blocks. At least one sub-set of the connections is in the form of a respective interlocking element which can be switched through an activation line (Scan Enable) from a normal mode to a test mode and which has a further data input and data output. The further data inputs and outputs are connected to one another by data line sections in such a manner that the interlocking elements form a shift register which provides a scan path. At least one electrically programmable protection element, which either interrupts a given line or connects it to a defined potential, is disposed along the activation line (Scan Enable) and/or the data line sections.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.