Test circuit for testing a circuit

US6618305B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Wolfgang Ernst · Munich, DE
• Gunnar Krause · Munich, DE
• Peter Poechmueller · Burlington, US
• Justus Kuhn · Birkenfeld, DE
• Jens Luepke · Birkenfeld, DE
• Jochen Mueller · Regensburg, DE
• Michael Schittenhelm · Poing, DE

Key dates

• Filing date: May 2, 2002
• Grant date: Sep 9, 2003
• Expiry date: May 2, 2022

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31926
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Test circuit for testing a circuit to be tested, having a test data generator, which generates test data in a manner dependent on data control signals which are received via data control lines from an external test unit, a data output driver for outputting the generated test data via data line pairs of a differential data bus to the circuit to be tested, a data input circuit for receiving data that are read from the circuit to be tested and transmitted via the data line pairs of the differential data bus, a data comparison circuit, which compares the generated data and the read-out data and, in a manner depend at on the comparison result transmits an indication signal, which indicates whether the circuit to be tested is functional, to the external test unit via an indication signal line.