Apparatus for and method of measuring a jitter
US6621860B1 · kind B1 · utility
22Cited by
10References
36Claims
0Family size
Inventors
Key dates
| Filing date | Feb 8, 1999 |
| Grant date | Sep 16, 2003 |
| Priority date | — |
| Expiry date | Feb 8, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is provided an apparatus for and a method of measuring a jitter wherein a clock waveform XC(t) is transformed into an analytic signal using Hilbert transform and a varying term &Dgr;&phgr;(t) of an instantaneous phase of this analytic signal is estimated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.