Mani Soma
37Patents
12h-index
16Co-inventors
74Inventor score
Filing activity: Mar 24, 1998 → Feb 14, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5980246A | Orthodontics headgear compliance monitor | Human Necessities | 141 | Expired |
| US6795496B1 | Jitter measuring device and method | Physics | 77 | Expired |
| US6922439B2 | Apparatus for and method of measuring jitter | Electricity | 29 | Expired |
| US6423558B1 | Method for fabricating integrated circuit (IC) dies with multi-layered interconnect structures | Electricity | 24 | Expired |
| US6621860B1 | Apparatus for and method of measuring a jitter | Physics | 22 | Expired |
| US6598004B1 | Jitter measurement apparatus and its method | Physics | 22 | Expired |
| US6687629B1 | Apparatus for and method of measuring a jitter | Physics | 20 | Expired |
| US6400129B1 | Apparatus for and method of detecting a delay fault in a phase-locked loop circuit | Physics | 16 | Expired |
| US7253443B2 | Electronic device with integrally formed light emitting device and supporting member | Electricity | 16 | Expired |
| US6460001B1 | Apparatus for and method of measuring a peak jitter | Electricity | 15 | Expired |
| US6885700B1 | Charge-based frequency measurement bist | Electricity | 12 | Expired |
| US6775321B1 | Apparatus for and method of measuring a jitter | Physics | 12 | Expired |
| US7636387B2 | Measuring apparatus and measuring method | Electricity | 11 | Active |
| US7054358B2 | Measuring apparatus and measuring method | Physics | 11 | Expired |
| US6594595B2 | Apparatus for and method of measuring cross-correlation coefficient between signals | Physics | 11 | Expired |
| US7317309B2 | Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatus | Physics | 11 | Expired |
| US7305025B2 | Measurement instrument and measurement method | Electricity | 10 | Expired |
| US7203229B1 | Apparatus for and method of measuring jitter | Physics | 10 | Expired |
| US6525523B1 | Jitter measurement apparatus and its method | Physics | 9 | Expired |
| US6291979A | Apparatus for and method of detecting a delay fault | Physics | 8 | Expired |
| US7127018B2 | Apparatus for and method of measuring clock skew | Electricity | 8 | Expired |
| US7313496B2 | Test apparatus and test method for testing a device under test | Physics | 7 | Expired |
| US7496137B2 | Apparatus for measuring jitter and method of measuring jitter | Physics | 6 | Active |
| US7193728B2 | Processing apparatus, processing method and position detecting device | Physics | 6 | Expired |
| US7397847B2 | Testing device for testing electronic device and testing method thereof | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.