Method monitoring a quality of electronic circuits and its manufacturing condition and system for it
US6622054B1 · kind B1 · utility
13Cited by
2References
16Claims
0Family size
Assignee
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Key dates
| Filing date | Oct 6, 1999 |
| Grant date | Sep 16, 2003 |
| Priority date | — |
| Expiry date | Oct 6, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
With a view to providing a monitoring system for the quality and manufacturing conditions of electronic circuits capable of facilitating the grasping of correlation's between diverse manufacturing conditions and manufacturing states, statistically characteristic images are selected out of a group of images retrieved from a detection information database by specifying at least one out of the values of feature quantities, design information and manufacturing conditions, and are displayed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.