Hideaki Doi
24Patents
13h-index
55Co-inventors
84Inventor score
Filing activity: Aug 7, 1979 → Aug 11, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5801965A | Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices | Physics | 144 | Expired |
| US4628531A | Pattern checking apparatus | Physics | 78 | Expired |
| US6278418A | Three-dimensional imaging system, game device, method for same and recording medium | Human Necessities | 70 | Expired |
| US6438438B1 | Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices | Physics | 59 | Expired |
| US4908871A | Pattern inspection system | Physics | 36 | Expired |
| US5754621A | X-ray inspection method and apparatus, prepreg inspecting method, and method for fabricating multi-layer printed circuit board | Electricity | 35 | Expired |
| US6546308B2 | Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices | Physics | 32 | Expired |
| US6087673A | Method of inspecting pattern and apparatus thereof | Physics | 31 | Expired |
| US6614923B1 | Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof | Electricity | 22 | Expired |
| US4962541A | Pattern test apparatus | Physics | 18 | Expired |
| US6650409B1 | Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system | Electricity | 18 | Expired |
| US6072899A | Method and device of inspecting three-dimensional shape defect | Physics | 17 | Expired |
| US5331407A | Method and apparatus for detecting a circuit pattern | Physics | 16 | Expired |
| US6622054B1 | Method monitoring a quality of electronic circuits and its manufacturing condition and system for it | Emerging Cross-Sectional Technologies | 13 | Expired |
| US4341837A | Laminar thermoplastic resin structure | Emerging Cross-Sectional Technologies | 10 | Expired |
| US6831998B1 | Inspection system for circuit patterns and a method thereof | Physics | 10 | Expired |
| US5930382A | Wiring pattern inspecting method and system for carrying out the same | Physics | 8 | Expired |
| US6236057A | Method of inspecting pattern and apparatus thereof with a differential brightness image detection | Physics | 8 | Expired |
| US7263216B2 | Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof | Electricity | 8 | Expired |
| US4975223A | Optical material | Physics | 7 | Expired |
| US6376854B2 | Method of inspecting a pattern on a substrate | Physics | 3 | Expired |
| US4504631A | Photoresist material | Chemistry; Metallurgy | 3 | Expired |
| US5308875A | Therapeutic coolant for the local treatment of burn | Emerging Cross-Sectional Technologies | 1 | Expired |
| US5086140A | Optical material formed by casting polymerization of a phenyl phosphine monomer | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.