Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices
US6653848B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 18, 2001 |
| Grant date | Nov 25, 2003 |
| Priority date | — |
| Expiry date | Dec 15, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for characterizing a device under test (“DUT”) calibrates a multiport test set and measures S-parameters [S] of the DUT. The method and apparatus further involves determining elements of a scalar orthogonal matrix [M] corresponding to terminals of the DUT and DUT modes of operation. The scalar orthogonal matrix [M] comprises a row of elements representing a single-ended terminal of the DUT, and four rows of elements representing a balanced terminal of the DUT. The S-parameters of the DUT are then transformed into mixed-mode S-parameters [Smm] according to Smm=MSM−1. A method of and apparatus for characterizing a DUT involves calibrating a multiport test set, coupling the DUT to the multiport test set, and measuring S-parameters of the DUT. The S-parameters are converted to a time domain representation and at least one of the S-parameters is convolved with a simulated input signal to generate an output response. The output response is then displayed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.