Patrick J. Enquist
3Patents
3h-index
3Co-inventors
36Inventor score
Filing activity: Sep 18, 2001 → Apr 7, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6920407B2 | Method and apparatus for calibrating a multiport test system for measurement of a DUT | Chemistry; Metallurgy | 153 | Expired |
| US6653848B2 | Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices | Physics | 152 | Expired |
| US6826506B2 | Method and apparatus for calibrating a multiport test system for measurement of a DUT | Physics | 16 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.