Testing device for testing a memory

US6661718B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Carsten Ohlhoff · Hersbruck, DE
• Peter Pöchmüller · Birkenfeld, DE

Key dates

• Filing date: Dec 31, 2001
• Grant date: Dec 9, 2003
• Expiry date: Dec 31, 2021

Classification

• Technology area (CPC G): Physics
• CPC primary: G11C29/006
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A substrate includes a memory and a testing device for testing the memory. The testing device includes an interpreter element that operates and tests the memory in accordance with a test program. The test program command codes are stored in the untested memory cell array of the memory that will be tested. The advantage of the testing device consists, inter alia, in the fact that the testing device no longer needs to be adapted to changed hardware properties of the chip generation or fabrication lines because the test program, which is suitable for the respective chip type, is stored as a variable code on the respective memory which is to be tested. It is thus also possible to test various memory chip types with the same testing device.