Carsten Ohlhoff
17Patents
6h-index
6Co-inventors
51Inventor score
Filing activity: Aug 2, 2000 → Apr 4, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7231562B2 | Memory module, test system and method for testing one or a plurality of memory modules | Physics | 145 | Expired |
| US6756787B2 | Integrated circuit having a current measuring unit | Physics | 14 | Expired |
| US6671221B2 | Semiconductor chip with trimmable oscillator | Physics | 11 | Expired |
| US6504394B2 | Configuration for trimming reference voltages in semiconductor chips, in particular semiconductor memories | Electricity | 10 | Expired |
| US7137049B2 | Method and apparatus for masking known fails during memory tests readouts | Physics | 8 | Expired |
| US6661718B2 | Testing device for testing a memory | Physics | 6 | Expired |
| US6657452B2 | Configuration for measurement of internal voltages of an integrated semiconductor apparatus | Physics | 5 | Expired |
| US6670665B2 | Memory module with improved electrical properties | Electricity | 4 | Expired |
| US7120841B2 | Data generator for generating test data for word-oriented semiconductor memories | Physics | 4 | Expired |
| US7107501B2 | Test device, test system and method for testing a memory circuit | Physics | 3 | Expired |
| US6891431B2 | Integrated semiconductor circuit configuration | Physics | 3 | Expired |
| US7197678B2 | Test circuit and method for testing an integrated memory circuit | Physics | 3 | Expired |
| US7490274B2 | Method and apparatus for masking known fails during memory tests readouts | Physics | 2 | Active |
| US6549028B1 | Configuration and process for testing a multiplicity of semiconductor chips on a wafer plane | Electricity | 2 | Expired |
| US6639856B2 | Memory chip having a test mode and method for checking memory cells of a repaired memory chip | Physics | 1 | Expired |
| US7092303B2 | Dynamic memory and method for testing a dynamic memory | Physics | 1 | Expired |
| US7574643B2 | Test apparatus and method for testing a circuit unit | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.