Measuring skew using on-chip sampling
US6662126B2 · kind B2 · utility
11Cited by
6References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 14, 2001 |
| Grant date | Dec 9, 2003 |
| Priority date | — |
| Expiry date | Feb 23, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31725
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus to determine skew of an on-chip signal without physical probing of the on-chip signal on the chip is provided. The method and apparatus use an externally generated reference signal that is distributed to one or more on-chip samplers that input the on-chip signal. Then, by modulating the externally generated reference signal, transitions of the on-chip signal can be detected at the one or more on-chip samplers so that the skew of the on-chip signal can be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.