Patent · US Expired

Electroless copper deposition method for preparing copper seed layers

US6664122B1 · kind B1 · utility

41Cited by
11References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 27, 2001
Grant dateDec 16, 2003
Priority date
Expiry dateMay 8, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/89
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Disclosed is a procedure for deposition of a thin and relatively continuous electroless copper film on the substrate of sub-micron integrated circuit features. The electroless copper film is deposited onto a previously deposited PVD copper film, which may be discontinuous. The continuous film formed by electroless deposition allows for sufficient filling of the sub-micron integrated circuit features by electrodeposition. The electroless bath employed to form the continuous electroless copper film may be composed of a reducing agent, a complexing agent, a source of copper ions, a pH adjuster, and optionally one or more surfactants and/or stabilizers. In one example, the reducing agent contains an aldehyde moiety.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.